Thickness

201 books
Monitoring thick-billed murre populations at colonies in northern Hudson Bay, 1972-92Unknown Author
⏱ 16m

Monitoring thick-billed murre populations at colonies in northern Hudson Bay, 1972-92

Unknown Author

199316 pp.
SchichtmesstechnikKarl Nitzsche
⏱ 6h 56m

Schichtmesstechnik

Karl Nitzsche

1974416 pp.
High-Tc fluorine-doped YBaCuOy films on ceramic substrates by screen printingNarottam P. Bansal

High-Tc fluorine-doped YBaCuOy films on ceramic substrates by screen printing

Narottam P. Bansal

1991No page data
Thick-film microelectronicsMorton L. Topfer
⏱ 3h 30m

Thick-film microelectronics

Morton L. Topfer

1971210 pp.
Assuring the integrity of multilayer substrates prior to assemblyRoger L. Cadenhead
⏱ 1h 10m

Assuring the integrity of multilayer substrates prior to assembly

Roger L. Cadenhead

198470 pp.
Thick seam mining, problems and issuesInternational Symposium on Thick Seam Mining.
⏱ 13h 15m

Thick seam mining, problems and issues

International Symposium on Thick Seam Mining.

1992795 pp.
The measurement of thicknessGeorge Keinath
⏱ 1h 19m

The measurement of thickness

George Keinath

195879 pp.
Mi du ce liang ji shuYuying Lian
⏱ 5h 44m

Mi du ce liang ji shu

Yuying Lian

1982344 pp.
A guide to methods and instruments for coating thickness measurementHeinz Plog
⏱ 2h 11m

A guide to methods and instruments for coating thickness measurement

Heinz Plog

1971131 pp.
Synthesis and characterization of high-Tc screen-printed Y-Ba-Cu-O films on aluminaNarottam P. Bansal

Synthesis and characterization of high-Tc screen-printed Y-Ba-Cu-O films on alumina

Narottam P. Bansal

1988No page data
A guide to methods and instruments for coating thickness measurementHeinz Plog
⏱ 2h 11m

A guide to methods and instruments for coating thickness measurement

Heinz Plog

1971131 pp.
Handbook of thick film technologyUnknown Author
⏱ 7h 10m

Handbook of thick film technology

Unknown Author

1976430 pp.
The Thick Of ItJames Walters
⏱ 2h 40m

The Thick Of It

James Walters

2016160 pp.
1995 International Symposium on MicroelectronicsInternational Symposium on Microelectronics (1995 Los Angeles, California)
⏱ 9h 22m

1995 International Symposium on Microelectronics

International Symposium on Microelectronics (1995 Los Angeles, California)

1995562 pp.
The effect of interface roughness and oxide film thickness on the inelastic response of thermal barrier coatings to thermal cyclingM.-J Pindera

The effect of interface roughness and oxide film thickness on the inelastic response of thermal barrier coatings to thermal cycling

M.-J Pindera

1999No page data
Thick film circuitsGeorge Victor Planer
⏱ 2h 32m

Thick film circuits

George Victor Planer

1972152 pp.
Pomiary grubości warstw wierzchnichRoman Janiczek
⏱ 2h 11m

Pomiary grubości warstw wierzchnich

Roman Janiczek

2007131 pp.
High-precision thickness measurements using beta backscatterR. V. Heckman
⏱ 28m

High-precision thickness measurements using beta backscatter

R. V. Heckman

197828 pp.
High-precision thickness measurements using beta backscatterR. V Heckman
⏱ 28m

High-precision thickness measurements using beta backscatter

R. V Heckman

197828 pp.
Measurement and analysis of atmospheric spectral optical depths with NASA Ames Airborne Sunphotometers during TARFOX and ACE-2John M. Livingston

Measurement and analysis of atmospheric spectral optical depths with NASA Ames Airborne Sunphotometers during TARFOX and ACE-2

John M. Livingston

1997No page data
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