Robert Keyse
Geoffrey A. Meek
Cecil Edwin Hall
Symposium on Applications of Electron Microfractography to Materials Research Toronto 1970.
Jeremy Burgess
R. Barer
J. K. Koehler
Erskine L. Palmer
T. Mulvey
Elizabeth M. Slayter
Peter J. Goodhew
Edmund Bertil Sandborn
John J. Bozzola
V. H. Heywood
Claude Magnan
Hutchison, John
Institute of Physics (Great Britain). Electron Microscopy and Analysis Group. Conference
Ian M. Watt
Ugo Valdre
Yasukazu Tanaka