Walter H. Buchsbaum
Unknown Author
IEEE Instrumentation and Measurement Society
Yongquan Fan
Lawrence M. Baker
Bo Lindgren
Willy M. C. Sansen
Risto Rannala
Paul Vincent Dressendorfer
James J. J. Barbarello
National Semiconductor Corporation
American National Standards Institute
Vishram S. Pandit
Jacob Fraden
Jonathan A. Titus
Joseph Carr
Howard Lee Evans