B. C. Eu
International Conference on Defect Recognition and Image Processing in Semiconductors (7th 1997 Templin, Germany)
M. Henkel
Avner Friedman
Enrique Tirapegui
D. Royer
Arkady Vainshtein
Ivor Brodie
T. Koshijima
Édouard Brézin
Claude Bris
Vladas Sidoravicius
Marinus T. Vlaardingerbroek
Salvatore Torquato
Peter Günter
Yu. K. Tovbin
Karsten König