Characteres

736 books
The present confict of idealsRalph Barton Perry
⏱ 9h 0m

The present confict of ideals

Ralph Barton Perry

1919540 pp.
Strategy and methodology for radioactive waste characterizationInternational Atomic Energy Agency
⏱ 2h 49m

Strategy and methodology for radioactive waste characterization

International Atomic Energy Agency

2007169 pp.
The practical use of fracture mechanicsDavid Broek
⏱ 8h 42m

The practical use of fracture mechanics

David Broek

1988522 pp.
The Oxide HandbookG. V. Samsonov
⏱ 8h 58m

The Oxide Handbook

G. V. Samsonov

1973538 pp.
Molten Salt ChemistryGleb Mamantov
⏱ 9h 16m

Molten Salt Chemistry

Gleb Mamantov

1987556 pp.
Scientific Basis for Nuclear Waste ManagementClyde J. Northrup

Scientific Basis for Nuclear Waste Management

Clyde J. Northrup

1980No page data
Modern Prestressed ConcreteJames R. Libby
⏱ 14h 52m

Modern Prestressed Concrete

James R. Libby

1971892 pp.
Low Dimensional Cooperative PhenomenaH. Keller
⏱ 5h 50m

Low Dimensional Cooperative Phenomena

H. Keller

1975350 pp.
Low-temperature physicsChristian Enss
⏱ 9h 41m

Low-temperature physics

Christian Enss

2005581 pp.
High efficiency surface-textured light-emitting diodesReiner Windisch
⏱ 2h 50m

High efficiency surface-textured light-emitting diodes

Reiner Windisch

2001170 pp.
Attorno al Farinata dantescoOrazio Bacci
⏱ 18m

Attorno al Farinata dantesco

Orazio Bacci

189718 pp.
Structure and Properties of IonomersMichel Pineri
⏱ 10h 0m

Structure and Properties of Ionomers

Michel Pineri

1987600 pp.
Health effects of land application of municipal sludgeNorman Edward Kowal
⏱ 1h 18m

Health effects of land application of municipal sludge

Norman Edward Kowal

198578 pp.
Statistical Metrology 2000 4th International WorkshopInternational Workshop on Statistical Metrology (5th : 2000 : Hawaii)
⏱ 1h 40m

Statistical Metrology 2000 4th International Workshop

International Workshop on Statistical Metrology (5th : 2000 : Hawaii)

2001100 pp.
Semiconductor characterizationW. Murray Bullis
⏱ 12h 9m

Semiconductor characterization

W. Murray Bullis

1996729 pp.
NCASI procedures for the preparation and isomer specific analysis of pulp and paper industry samples for 2,3,7,8-TCDD and 2,3,7,8-TCDFLawrence E. LaFleur
⏱ 57m

NCASI procedures for the preparation and isomer specific analysis of pulp and paper industry samples for 2,3,7,8-TCDD and 2,3,7,8-TCDF

Lawrence E. LaFleur

198957 pp.
1997 2nd International Workshop on Statistical Metrology, June 8, 1997, KyotoInternational Workshop on Statistical Metrology (2nd 1997 Kyoto, Japan)
⏱ 2h 4m

1997 2nd International Workshop on Statistical Metrology, June 8, 1997, Kyoto

International Workshop on Statistical Metrology (2nd 1997 Kyoto, Japan)

1997124 pp.
Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industryBullis, W. Murray.

Survey of optical characterization methods for materials, processing, and manufacturing in the semiconductor industry

Bullis, W. Murray.

1995No page data
An investigation into biosolids sampling and handling methods for U.S. EPA-approved microbial detection techniquesSharon C. Long

An investigation into biosolids sampling and handling methods for U.S. EPA-approved microbial detection techniques

Sharon C. Long

2009No page data
Joint NRC/EPA sewage sludge radiological surveyInteragency Steering Committee on Radiation Standards (U.S.). Sewage Subcommittee
⏱ 10m

Joint NRC/EPA sewage sludge radiological survey

Interagency Steering Committee on Radiation Standards (U.S.). Sewage Subcommittee

199910 pp.
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