Automatic Test Equipment

199 books
The Military test equipment market in the U.S.Frost & Sullivan
⏱ 5h 38m

The Military test equipment market in the U.S.

Frost & Sullivan

1986338 pp.
Applying independent verification and validation to automatic test equipmentCynthia C. Calhoun

Applying independent verification and validation to automatic test equipment

Cynthia C. Calhoun

1997No page data
The Military test equipment market in the U.S.Frost & Sullivan
⏱ 4h 5m

The Military test equipment market in the U.S.

Frost & Sullivan

1983245 pp.
The military (and commercial airline) ATE marketFrost & Sullivan
⏱ 3h 39m

The military (and commercial airline) ATE market

Frost & Sullivan

1974219 pp.
The Electronic component-circuit board automatic test equipment & microprocessor development systems markets in West EuropeUnknown Author
⏱ 4h 18m

The Electronic component-circuit board automatic test equipment & microprocessor development systems markets in West Europe

Unknown Author

1981258 pp.
Military readinessUnited States. General Accounting Office
⏱ 24m

Military readiness

United States. General Accounting Office

200324 pp.
The Semiconductor ATE, handling and environmental stress equipment markets in the U.S.Unknown Author
⏱ 3h 23m

The Semiconductor ATE, handling and environmental stress equipment markets in the U.S.

Unknown Author

1982203 pp.
Fault detection in asynchronous sequential machinesAaron Ashkinazy
⏱ 3h 11m

Fault detection in asynchronous sequential machines

Aaron Ashkinazy

1970191 pp.
Testability concepts for digital ICsF. P. M. Beenker
⏱ 3h 32m

Testability concepts for digital ICs

F. P. M. Beenker

1995212 pp.
Design-for-Test for Digital IC's and Embedded Core SystemsAlfred Crouch
⏱ 5h 48m

Design-for-Test for Digital IC's and Embedded Core Systems

Alfred Crouch

1999348 pp.
Competent expert systemsE. T. Keravnou
⏱ 5h 20m

Competent expert systems

E. T. Keravnou

1986320 pp.
Prelaunch checkout in the 1970sL. T. Mast

Prelaunch checkout in the 1970s

L. T. Mast

1967No page data
International Test Conference, 1991International Test Conference (22nd 1991 Nashville, Tenn.)
⏱ 18h 55m

International Test Conference, 1991

International Test Conference (22nd 1991 Nashville, Tenn.)

19911135 pp.
Designing, testing, and diagnostics--join themInternational Test Conference (1993 Baltimore, Md.)
⏱ 17h 45m

Designing, testing, and diagnostics--join them

International Test Conference (1993 Baltimore, Md.)

19931065 pp.
ETC 93, Third European Test Conference, Rotterdam, the Netherlands, April 19-22, 1993European Test Conference (3rd 1993 Rotterdam, Netherlands)
⏱ 9h 8m

ETC 93, Third European Test Conference, Rotterdam, the Netherlands, April 19-22, 1993

European Test Conference (3rd 1993 Rotterdam, Netherlands)

1993548 pp.
1983 IEEE ATPG Workshop proceedingsAutomatic Test Program Generation Workshop (3rd 1983 San Francisco, Calif.)
⏱ 2h 13m

1983 IEEE ATPG Workshop proceedings

Automatic Test Program Generation Workshop (3rd 1983 San Francisco, Calif.)

1983133 pp.
Tutorial DSP-based testing of analog and mixed-signal circuitsMatthew Mahoney
⏱ 4h 17m

Tutorial DSP-based testing of analog and mixed-signal circuits

Matthew Mahoney

1987257 pp.
Integration of test with design and manufacturingInternational Test Conference (18th 1987 Washington, D.C.)
⏱ 19h 11m

Integration of test with design and manufacturing

International Test Conference (18th 1987 Washington, D.C.)

19871151 pp.
New frontiers in testingInternational Test Conference (1988 Washington, D.C.)
⏱ 16h 45m

New frontiers in testing

International Test Conference (1988 Washington, D.C.)

19881005 pp.
Sensor handbook for automatic test, monitoring, diagnostic, and control systems applications to military vehicles and machineryPaul S. Lederer
⏱ 7h 16m

Sensor handbook for automatic test, monitoring, diagnostic, and control systems applications to military vehicles and machinery

Paul S. Lederer

1981436 pp.
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